diff --git a/data/ANSI_C63.14-2014.yaml b/data/ANSI_C63.14-2014.yaml
index 9bd766e9e93..b7cf82be1d2 100644
--- a/data/ANSI_C63.14-2014.yaml
+++ b/data/ANSI_C63.14-2014.yaml
@@ -704,6 +704,40 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: ANSIC63.14-2009
+    docid:
+    - id: ANSI C63.14-2009
+      type: IEEE
+      primary: true
+    formattedref:
+      content: ANSI C63.14-2009
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: ANSIC63.14-2009
+    docid:
+    - id: ANSI C63.14-2009
+      type: IEEE
+      primary: true
+    formattedref:
+      content: ANSI C63.14-2009
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: ANSI standards
 - content: Dictionaries
diff --git a/data/ANSI_C63.14-2014_REDLINE.yaml b/data/ANSI_C63.14-2014_REDLINE.yaml
index 3c997699452..ebc0250aca9 100644
--- a/data/ANSI_C63.14-2014_REDLINE.yaml
+++ b/data/ANSI_C63.14-2014_REDLINE.yaml
@@ -485,6 +485,40 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: ANSIC63.14-2009
+    docid:
+    - id: ANSI C63.14-2009
+      type: IEEE
+      primary: true
+    formattedref:
+      content: ANSI C63.14-2009
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: ANSIC63.14-2009
+    docid:
+    - id: ANSI C63.14-2009
+      type: IEEE
+      primary: true
+    formattedref:
+      content: ANSI C63.14-2009
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: ANSI C63.14
 - content: electromagnetic compatibility (EMC)
diff --git a/data/ANSI_C63.15-2010.yaml b/data/ANSI_C63.15-2010.yaml
index 72a98438de2..77391d99b07 100644
--- a/data/ANSI_C63.15-2010.yaml
+++ b/data/ANSI_C63.15-2010.yaml
@@ -191,6 +191,16 @@ relation:
     formattedref:
       content: ANSI C63.15-2017
       format: text/plain
+- type: obsoletedBy
+  bibitem:
+    id: ANSIC63.15-2017
+    docid:
+    - id: ANSI C63.15-2017
+      type: IEEE
+      primary: true
+    formattedref:
+      content: ANSI C63.15-2017
+      format: text/plain
 keyword:
 - content: IEEE standards
 - content: electromagnetic compatibility
diff --git a/data/ANSI_N42.34-2015.yaml b/data/ANSI_N42.34-2015.yaml
index 1b8592d0cd1..e92a1d526df 100644
--- a/data/ANSI_N42.34-2015.yaml
+++ b/data/ANSI_N42.34-2015.yaml
@@ -657,6 +657,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: ANSIN42.34-2006
+    docid:
+    - id: ANSI N42.34-2006
+      type: IEEE
+      primary: true
+    formattedref:
+      content: ANSI N42.34-2006
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: ANSI Standards
 - content: Gamma rays
diff --git a/data/ANSI_USEMCSC_C63.2-2023.yaml b/data/ANSI_USEMCSC_C63.2-2023.yaml
index 9f4224cd4ff..6cfe57d0161 100644
--- a/data/ANSI_USEMCSC_C63.2-2023.yaml
+++ b/data/ANSI_USEMCSC_C63.2-2023.yaml
@@ -1097,6 +1097,40 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: ANSIC63.2-2016
+    docid:
+    - id: ANSI C63.2-2016
+      type: IEEE
+      primary: true
+    formattedref:
+      content: ANSI C63.2-2016
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: ANSIC63.2-2016
+    docid:
+    - id: ANSI C63.2-2016
+      type: IEEE
+      primary: true
+    formattedref:
+      content: ANSI C63.2-2016
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Electromagnetic interference
diff --git a/data/ANSI_USEMCSC_C63.2-2023_REDLINE.yaml b/data/ANSI_USEMCSC_C63.2-2023_REDLINE.yaml
index 09b2f10a24b..74c5ba75ba0 100644
--- a/data/ANSI_USEMCSC_C63.2-2023_REDLINE.yaml
+++ b/data/ANSI_USEMCSC_C63.2-2023_REDLINE.yaml
@@ -70,6 +70,40 @@ copyright:
     url: http://www.ieee.org
   from: '2023'
 relation:
+- type: updates
+  bibitem:
+    id: ANSIC63.2-2016
+    docid:
+    - id: ANSI C63.2-2016
+      type: IEEE
+      primary: true
+    formattedref:
+      content: ANSI C63.2-2016
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: ANSIC63.2-2016
+    docid:
+    - id: ANSI C63.2-2016
+      type: IEEE
+      primary: true
+    formattedref:
+      content: ANSI C63.2-2016
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 - type: updates
   bibitem:
     id: ANSIC63.2-2016
diff --git a/data/IEEE_1003.1-2017.yaml b/data/IEEE_1003.1-2017.yaml
index b8c1fca13b1..08940c2a494 100644
--- a/data/IEEE_1003.1-2017.yaml
+++ b/data/IEEE_1003.1-2017.yaml
@@ -525,6 +525,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE1003.1-2008
+    docid:
+    - id: IEEE 1003.1-2008
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 1003.1-2008
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Operating systems
diff --git a/data/IEEE_11073.10419-2017.yaml b/data/IEEE_11073.10419-2017.yaml
index b8688cf4397..3880aafc9fb 100644
--- a/data/IEEE_11073.10419-2017.yaml
+++ b/data/IEEE_11073.10419-2017.yaml
@@ -662,6 +662,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE11073.10419-2015
+    docid:
+    - id: IEEE 11073.10419-2015
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 11073.10419-2015
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Medical devices
diff --git a/data/IEEE_11073.10419-2017_REDLINE.yaml b/data/IEEE_11073.10419-2017_REDLINE.yaml
index 88d1708d4e6..e96527afa17 100644
--- a/data/IEEE_11073.10419-2017_REDLINE.yaml
+++ b/data/IEEE_11073.10419-2017_REDLINE.yaml
@@ -647,6 +647,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE11073.10419-2015
+    docid:
+    - id: IEEE 11073.10419-2015
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 11073.10419-2015
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Medical services
diff --git a/data/IEEE_1366-2012.yaml b/data/IEEE_1366-2012.yaml
index f4ec2e90302..1c23787fb9e 100644
--- a/data/IEEE_1366-2012.yaml
+++ b/data/IEEE_1366-2012.yaml
@@ -355,6 +355,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE1366-2003
+    docid:
+    - id: IEEE 1366-2003
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 1366-2003
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE standards
 - content: Indexes
diff --git a/data/IEEE_1366-2012_REDLINE.yaml b/data/IEEE_1366-2012_REDLINE.yaml
index c45c7edb974..7a62f98b16d 100644
--- a/data/IEEE_1366-2012_REDLINE.yaml
+++ b/data/IEEE_1366-2012_REDLINE.yaml
@@ -168,6 +168,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE1366-2003
+    docid:
+    - id: IEEE 1366-2003
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 1366-2003
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE standards
 - content: Power system reliability
diff --git a/data/IEEE_1493-2024.yaml b/data/IEEE_1493-2024.yaml
new file mode 100644
index 00000000000..e6ded268296
--- /dev/null
+++ b/data/IEEE_1493-2024.yaml
@@ -0,0 +1,122 @@
+---
+schema-version: v1.2.3
+id: IEEE1493-2024
+title:
+- content: IEEE Guide for Evaluation of Solvents Used for Cleaning Electrical Cables
+    and Accessories
+  format: text/plain
+  type: main
+link:
+- content: https://ieeexplore.ieee.org/document/10679673
+  type: src
+type: standard
+docid:
+- id: IEEE 1493-2024
+  type: IEEE
+  primary: true
+- id: IEEE 1493™-2024
+  type: IEEE
+  scope: trademark
+  primary: true
+- id: 979-8-8557-1071-7
+  type: ISBN
+- id: 10.1109/IEEESTD.2024.10679673
+  type: DOI
+docnumber: IEEE 1493-2024
+date:
+- type: created
+  value: '2024'
+- type: published
+  value: '2024-09-13'
+- type: issued
+  value: '2024-05-20'
+contributor:
+- organization:
+    name:
+    - content: Institute of Electrical and Electronics Engineers
+    abbreviation:
+      content: IEEE
+    url: http://www.ieee.org
+    contact:
+    - address:
+        city: New York
+        country: USA
+  role:
+  - type: publisher
+revdate: '2024-09-13'
+language:
+- en
+script:
+- Latn
+abstract:
+- content: Test procedures for evaluating the physical characteristics of cable-cleaning
+    solvents and their compatibility with extruded dielectric cable components and
+    cable accessories (joints and terminations) are provided in this guide. Compatibility
+    is established by placing component samples in contact with the cleaning solvent
+    for a short period and then measuring the physical or electrical properties of
+    the component. The measured values are compared with values for samples that have
+    not been in contact with the cleaner. Suggested performance values are provided.
+    Also provided are suggested procedures for evaluating the cleaning effectiveness
+    of cable-cleaning solvents. Absolute performance values are not provided by these
+    comparative test procedures.
+  language:
+  - en
+  script:
+  - Latn
+  format: text/plain
+docstatus:
+  stage:
+    value: approved
+copyright:
+- owner:
+  - name:
+    - content: Institute of Electrical and Electronics Engineers
+    abbreviation:
+      content: IEEE
+    url: http://www.ieee.org
+  from: '2024'
+relation:
+- type: updates
+  bibitem:
+    id: IEEE1493-2006
+    docid:
+    - id: IEEE 1493-2006
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 1493-2006
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+keyword:
+- content: IEEE Standards
+- content: Solvents
+- content: Cleaning
+- content: Cables
+- content: Electronic equipment
+- content: Cable insulation
+- content: cable accessories
+- content: cleaning effectiveness
+- content: compatibility
+- content: extruded dielectric cable
+- content: IEEE 1493
+doctype: standard
+editorialgroup:
+  committee:
+  - Insulated Conductors of the IEEE Power and Energy Society
+ics:
+- code: 29.060.20
+  text: Cables
+- code: 87.060.30
+  text: Solvents
+ext:
+  schema-version: v1.0.0
+  standard_status: Active
+  standard_modified: Approved
+  pubstatus: Active
+  holdstatus: Publish
diff --git a/data/IEEE_1636.1-2018.yaml b/data/IEEE_1636.1-2018.yaml
index 77258e45cbb..3cfdc5d013a 100644
--- a/data/IEEE_1636.1-2018.yaml
+++ b/data/IEEE_1636.1-2018.yaml
@@ -2319,6 +2319,159 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE1636.1-2013Redline
+    docid:
+    - id: IEEE 1636.1-2013 Redline
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 1636.1-2013 Redline
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE1636.1-2013Redline
+    docid:
+    - id: IEEE 1636.1-2013 Redline
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 1636.1-2013 Redline
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE1636.1-2013Redline
+    docid:
+    - id: IEEE 1636.1-2013 Redline
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 1636.1-2013 Redline
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE1636.1-2013Redline
+    docid:
+    - id: IEEE 1636.1-2013 Redline
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 1636.1-2013 Redline
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE1636.1-2013Redline
+    docid:
+    - id: IEEE 1636.1-2013 Redline
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 1636.1-2013 Redline
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE1636.1-2013Redline
+    docid:
+    - id: IEEE 1636.1-2013 Redline
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 1636.1-2013 Redline
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE1636.1-2013Redline
+    docid:
+    - id: IEEE 1636.1-2013 Redline
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 1636.1-2013 Redline
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE1636.1-2013Redline
+    docid:
+    - id: IEEE 1636.1-2013 Redline
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 1636.1-2013 Redline
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE1636.1-2013Redline
+    docid:
+    - id: IEEE 1636.1-2013 Redline
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 1636.1-2013 Redline
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Software maintenance
diff --git a/data/IEEE_515-2017.yaml b/data/IEEE_515-2017.yaml
index e0ba43ed775..5324073adec 100644
--- a/data/IEEE_515-2017.yaml
+++ b/data/IEEE_515-2017.yaml
@@ -868,6 +868,74 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE515-2011
+    docid:
+    - id: IEEE 515-2011
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 515-2011
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE515-2011
+    docid:
+    - id: IEEE 515-2011
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 515-2011
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE515-2011
+    docid:
+    - id: IEEE 515-2011
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 515-2011
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE515-2011
+    docid:
+    - id: IEEE 515-2011
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 515-2011
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Trace heating
diff --git a/data/IEEE_802.15.3D-2017.yaml b/data/IEEE_802.15.3D-2017.yaml
index debd27f05bb..f2c166bb231 100644
--- a/data/IEEE_802.15.3D-2017.yaml
+++ b/data/IEEE_802.15.3D-2017.yaml
@@ -152,6 +152,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE802.15.3-2003
+    docid:
+    - id: IEEE 802.15.3-2003
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 802.15.3-2003
+      format: text/plain
+  description:
+    content: amends
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Multimedia communication
diff --git a/data/IEEE_802.15.3E-2017.yaml b/data/IEEE_802.15.3E-2017.yaml
index 3d10f5b6424..c37d515a87d 100644
--- a/data/IEEE_802.15.3E-2017.yaml
+++ b/data/IEEE_802.15.3E-2017.yaml
@@ -154,6 +154,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE802.15.3-2003
+    docid:
+    - id: IEEE 802.15.3-2003
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 802.15.3-2003
+      format: text/plain
+  description:
+    content: amends
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Millimeter wave communication
diff --git a/data/IEEE_830-1998.yaml b/data/IEEE_830-1998.yaml
index f2f25b833af..9a1affc1cd2 100644
--- a/data/IEEE_830-1998.yaml
+++ b/data/IEEE_830-1998.yaml
@@ -493,6 +493,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE830-1993
+    docid:
+    - id: IEEE 830-1993
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 830-1993
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: Software requirements and specifications
 - content: contract
diff --git a/data/IEEE_933-2013.yaml b/data/IEEE_933-2013.yaml
index dd023900c95..6367b32f5f1 100644
--- a/data/IEEE_933-2013.yaml
+++ b/data/IEEE_933-2013.yaml
@@ -911,6 +911,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE933-1999
+    docid:
+    - id: IEEE 933-1999
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 933-1999
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE standards
 - content: Nuclear power generation
diff --git a/data/IEEE_933-2013_REDLINE.yaml b/data/IEEE_933-2013_REDLINE.yaml
index 733a0e24e7e..f220fc501c5 100644
--- a/data/IEEE_933-2013_REDLINE.yaml
+++ b/data/IEEE_933-2013_REDLINE.yaml
@@ -512,6 +512,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE933-1999
+    docid:
+    - id: IEEE 933-1999
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 933-1999
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE standards
 - content: Nuclear power generation
diff --git a/data/IEEE_C37.011-2019.yaml b/data/IEEE_C37.011-2019.yaml
index 171c2b3aa3a..6adee258096 100644
--- a/data/IEEE_C37.011-2019.yaml
+++ b/data/IEEE_C37.011-2019.yaml
@@ -208,6 +208,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEEC37.011-2011
+    docid:
+    - id: IEEE C37.011-2011
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE C37.011-2011
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Transient analysis
diff --git a/data/IEEE_C37.012-2014.yaml b/data/IEEE_C37.012-2014.yaml
index b66e4570faa..f902e52cbe0 100644
--- a/data/IEEE_C37.012-2014.yaml
+++ b/data/IEEE_C37.012-2014.yaml
@@ -641,6 +641,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEEC37.012-2005
+    docid:
+    - id: IEEE C37.012-2005
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE C37.012-2005
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE standards
 - content: AC machines
diff --git a/data/IEEE_C37.20.9A-2024.yaml b/data/IEEE_C37.20.9A-2024.yaml
index b3a1094076a..06adf2f08b5 100644
--- a/data/IEEE_C37.20.9A-2024.yaml
+++ b/data/IEEE_C37.20.9A-2024.yaml
@@ -584,6 +584,57 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEEC37.20.9-2019
+    docid:
+    - id: IEEE C37.20.9-2019
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE C37.20.9-2019
+      format: text/plain
+  description:
+    content: amends
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: IEEEC37.20.9-2019
+    docid:
+    - id: IEEE C37.20.9-2019
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE C37.20.9-2019
+      format: text/plain
+  description:
+    content: amends
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: IEEEC37.20.9-2019
+    docid:
+    - id: IEEE C37.20.9-2019
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE C37.20.9-2019
+      format: text/plain
+  description:
+    content: amends
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE C37.20.9™
 - content: metal-enclosed power switchgear
diff --git a/data/IEEE_C37.63-2013.yaml b/data/IEEE_C37.63-2013.yaml
index c5efe0faa05..002cc9b51cb 100644
--- a/data/IEEE_C37.63-2013.yaml
+++ b/data/IEEE_C37.63-2013.yaml
@@ -325,6 +325,57 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEEC37.63-2005
+    docid:
+    - id: IEEE C37.63-2005
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE C37.63-2005
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: IEEEC37.63-2005
+    docid:
+    - id: IEEE C37.63-2005
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE C37.63-2005
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: IEEEC37.63-2005
+    docid:
+    - id: IEEE C37.63-2005
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE C37.63-2005
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE standards
 - content: Underwater power cables
diff --git a/data/IEEE_C37.63-2013_REDLINE.yaml b/data/IEEE_C37.63-2013_REDLINE.yaml
index ee905d18b73..2441a4403ec 100644
--- a/data/IEEE_C37.63-2013_REDLINE.yaml
+++ b/data/IEEE_C37.63-2013_REDLINE.yaml
@@ -188,6 +188,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEEC37.63-2005
+    docid:
+    - id: IEEE C37.63-2005
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE C37.63-2005
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE standards
 - content: Power cables
diff --git a/data/IEEE_C57.105_COR1-2023.yaml b/data/IEEE_C57.105_COR1-2023.yaml
index 1b2dc114380..2579193e296 100644
--- a/data/IEEE_C57.105_COR1-2023.yaml
+++ b/data/IEEE_C57.105_COR1-2023.yaml
@@ -735,6 +735,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEEC57.105-2019
+    docid:
+    - id: IEEE C57.105-2019
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE C57.105-2019
+      format: text/plain
+  description:
+    content: corrects
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Transformers
diff --git a/data/IEEE_C57.12.28-2023.yaml b/data/IEEE_C57.12.28-2023.yaml
index 4dbdd5d27cd..d45a33a8288 100644
--- a/data/IEEE_C57.12.28-2023.yaml
+++ b/data/IEEE_C57.12.28-2023.yaml
@@ -785,6 +785,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEEC57.12.28-2014
+    docid:
+    - id: IEEE C57.12.28-2014
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE C57.12.28-2014
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Coatings
diff --git a/data/IEEE_C57.12.29-2023.yaml b/data/IEEE_C57.12.29-2023.yaml
index ca85c87463f..742c4639f6b 100644
--- a/data/IEEE_C57.12.29-2023.yaml
+++ b/data/IEEE_C57.12.29-2023.yaml
@@ -786,6 +786,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEEC57.12.29-2014
+    docid:
+    - id: IEEE C57.12.29-2014
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE C57.12.29-2014
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Voltage control
diff --git a/data/IEEE_C57.12.40-2017.yaml b/data/IEEE_C57.12.40-2017.yaml
index 489323a5888..e39bfd4b9d1 100644
--- a/data/IEEE_C57.12.40-2017.yaml
+++ b/data/IEEE_C57.12.40-2017.yaml
@@ -566,6 +566,57 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEEC57.12.40-2011Redline
+    docid:
+    - id: IEEE C57.12.40-2011 Redline
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE C57.12.40-2011 Redline
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: IEEEC57.12.40-2011Redline
+    docid:
+    - id: IEEE C57.12.40-2011 Redline
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE C57.12.40-2011 Redline
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: IEEEC57.12.40-2011Redline
+    docid:
+    - id: IEEE C57.12.40-2011 Redline
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE C57.12.40-2011 Redline
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Power transformers
diff --git a/data/IEEE_N42.38-2022.yaml b/data/IEEE_N42.38-2022.yaml
index 2eda9cdf5ea..bd79b783ea7 100644
--- a/data/IEEE_N42.38-2022.yaml
+++ b/data/IEEE_N42.38-2022.yaml
@@ -446,6 +446,40 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: ANSIN42.38-2006
+    docid:
+    - id: ANSI N42.38-2006
+      type: IEEE
+      primary: true
+    formattedref:
+      content: ANSI N42.38-2006
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: ANSIN42.38-2006
+    docid:
+    - id: ANSI N42.38-2006
+      type: IEEE
+      primary: true
+    formattedref:
+      content: ANSI N42.38-2006
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Spectroscopy
diff --git a/data/IEEE_N42.38-2022_REDLINE.yaml b/data/IEEE_N42.38-2022_REDLINE.yaml
index c7ead29b89b..a38accc0c1b 100644
--- a/data/IEEE_N42.38-2022_REDLINE.yaml
+++ b/data/IEEE_N42.38-2022_REDLINE.yaml
@@ -71,6 +71,23 @@ copyright:
     url: http://www.ieee.org
   from: '2023'
 relation:
+- type: updates
+  bibitem:
+    id: ANSIN42.38-2006
+    docid:
+    - id: ANSI N42.38-2006
+      type: IEEE
+      primary: true
+    formattedref:
+      content: ANSI N42.38-2006
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 - type: updates
   bibitem:
     id: ANSIN42.38-2006
diff --git a/data/IEEE_P1679.1_D-2.20-2024-06.yaml b/data/IEEE_P1679.1_D-2.20-2024-06.yaml
index 1292f9bbe2f..14660dac2ee 100644
--- a/data/IEEE_P1679.1_D-2.20-2024-06.yaml
+++ b/data/IEEE_P1679.1_D-2.20-2024-06.yaml
@@ -470,6 +470,40 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE1679.1-2017
+    docid:
+    - id: IEEE 1679.1-2017
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 1679.1-2017
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE1679.1-2017
+    docid:
+    - id: IEEE 1679.1-2017
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 1679.1-2017
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: battery
 - content: energy storage
diff --git a/data/IEEE_P1722.REV1_D-13-2015-04.yaml b/data/IEEE_P1722.REV1_D-13-2015-04.yaml
index f6cd32b3ba0..2edcada1ab0 100644
--- a/data/IEEE_P1722.REV1_D-13-2015-04.yaml
+++ b/data/IEEE_P1722.REV1_D-13-2015-04.yaml
@@ -357,6 +357,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE1722-2011
+    docid:
+    - id: IEEE 1722-2011
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 1722-2011
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Media streaming
diff --git a/data/IEEE_P1847_D-1-2024-09.yaml b/data/IEEE_P1847_D-1-2024-09.yaml
index dfc4c86264a..0fdd8918ef7 100644
--- a/data/IEEE_P1847_D-1-2024-09.yaml
+++ b/data/IEEE_P1847_D-1-2024-09.yaml
@@ -118,6 +118,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE1847-2019
+    docid:
+    - id: IEEE 1847-2019
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 1847-2019
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Location awareness
diff --git a/data/IEEE_P2815_D-6-2024-06.yaml b/data/IEEE_P2815_D-6-2024-06.yaml
new file mode 100644
index 00000000000..dcf5157dcba
--- /dev/null
+++ b/data/IEEE_P2815_D-6-2024-06.yaml
@@ -0,0 +1,93 @@
+---
+schema-version: v1.2.3
+id: IEEEP2815-D-6-2024-06
+title:
+- content: IEEE Draft Standard for Evaluation Method of Machine Learning Fairness
+  format: text/plain
+  type: main
+link:
+- content: https://ieeexplore.ieee.org/document/10679699
+  type: src
+type: standard
+docid:
+- id: IEEE P2815/D-6-2024-06
+  type: IEEE
+  primary: true
+- id: IEEE P2815™/D-6-2024-06
+  type: IEEE
+  scope: trademark
+  primary: true
+- id: 979-8-8557-1253-7
+  type: ISBN
+docnumber: IEEE P2815/D-6-2024-06
+date:
+- type: created
+  value: '2024'
+- type: published
+  value: '2024-09-12'
+- type: issued
+  value: '2024'
+contributor:
+- organization:
+    name:
+    - content: Institute of Electrical and Electronics Engineers
+    abbreviation:
+      content: IEEE
+    url: http://www.ieee.org
+    contact:
+    - address:
+        city: New York
+        country: USA
+  role:
+  - type: publisher
+revdate: '2024-09-12'
+language:
+- en
+script:
+- Latn
+abstract:
+- content: This document specifies a method for evaluating the fairness of machine
+    learning. Multiple causes contribute to the unfairness of machine learning. In
+    this document, these causes of machine learning unfairness are categorized. The
+    widely recognized and used definitions of machine learning fairness are presented.
+    This document also specifies various metrics corresponding to the definitions,
+    and how to calculate the metrics. Test cases in this document give detailed conditions
+    and procedures to set up the tests for evaluating machine learning fairness.
+  language:
+  - en
+  script:
+  - Latn
+  format: text/plain
+docstatus:
+  stage:
+    value: draft
+copyright:
+- owner:
+  - name:
+    - content: Institute of Electrical and Electronics Engineers
+    abbreviation:
+      content: IEEE
+    url: http://www.ieee.org
+  from: '2024'
+keyword:
+- content: IEEE Standards
+- content: Machine learning
+- content: Performance evaluation
+- content: Quality assessment
+- content: Ethics
+- content: Artificial intelligence
+- content: machine learning
+- content: fairness
+- content: evaluation method
+- content: evaluation metric
+- content: bias
+doctype: standard
+editorialgroup:
+  committee:
+  - Artificial Intelligence Standards Committee of the IEEE Computer Society
+ext:
+  schema-version: v1.0.0
+  standard_status: Active
+  standard_modified: Draft
+  pubstatus: Active
+  holdstatus: Hold
diff --git a/data/IEEE_P3216_D-4.1-2024-08.yaml b/data/IEEE_P3216_D-4.1-2024-08.yaml
new file mode 100644
index 00000000000..c512b1c0196
--- /dev/null
+++ b/data/IEEE_P3216_D-4.1-2024-08.yaml
@@ -0,0 +1,88 @@
+---
+schema-version: v1.2.3
+id: IEEEP3216-D-4.1-2024-08
+title:
+- content: IEEE Draft Standard for Blockchain Service Capability Evaluation
+  format: text/plain
+  type: main
+link:
+- content: https://ieeexplore.ieee.org/document/10679696
+  type: src
+type: standard
+docid:
+- id: IEEE P3216/D-4.1-2024-08
+  type: IEEE
+  primary: true
+- id: IEEE P3216™/D-4.1-2024-08
+  type: IEEE
+  scope: trademark
+  primary: true
+- id: 979-8-8557-1251-3
+  type: ISBN
+docnumber: IEEE P3216/D-4.1-2024-08
+date:
+- type: created
+  value: '2024'
+- type: published
+  value: '2024-09-12'
+- type: issued
+  value: '2024'
+contributor:
+- organization:
+    name:
+    - content: Institute of Electrical and Electronics Engineers
+    abbreviation:
+      content: IEEE
+    url: http://www.ieee.org
+    contact:
+    - address:
+        city: New York
+        country: USA
+  role:
+  - type: publisher
+revdate: '2024-09-12'
+language:
+- en
+script:
+- Latn
+abstract:
+- content: 'This document establishes a blockchain service capability model, including
+    four levels: basic, expansion, optimization and leading, which are indicated by
+    I, II, III and IV respectively from low to high. At the same time, it stipulates
+    the requirements that the service capability at all levels shall meet in terms
+    of organization, personnel, technology, resources, and management processes.'
+  language:
+  - en
+  script:
+  - Latn
+  format: text/plain
+docstatus:
+  stage:
+    value: draft
+copyright:
+- owner:
+  - name:
+    - content: Institute of Electrical and Electronics Engineers
+    abbreviation:
+      content: IEEE
+    url: http://www.ieee.org
+  from: '2024'
+keyword:
+- content: IEEE Standards
+- content: Blockchains
+- content: Performance evaluation
+- content: Distributed ledger
+- content: Resource management
+- content: Quality of service
+- content: blockchains
+- content: service capability evaluation
+doctype: standard
+editorialgroup:
+  committee:
+  - Blockchain and Distributed Ledgers of the IEEE Computer Society
+ext:
+  schema-version: v1.0.0
+  standard_status: Active
+  standard_modified: Draft
+  pubstatus: Active
+  holdstatus: Hold
diff --git a/data/IEEE_P802.15.16T_D-4.0-2024-07.yaml b/data/IEEE_P802.15.16T_D-4.0-2024-07.yaml
index 40a93129af2..cb677851508 100644
--- a/data/IEEE_P802.15.16T_D-4.0-2024-07.yaml
+++ b/data/IEEE_P802.15.16T_D-4.0-2024-07.yaml
@@ -70,6 +70,40 @@ copyright:
     url: http://www.ieee.org
   from: '2024'
 relation:
+- type: updates
+  bibitem:
+    id: IEEE802.16-2017
+    docid:
+    - id: IEEE 802.16-2017
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 802.16-2017
+      format: text/plain
+  description:
+    content: amends
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE802.16-2017
+    docid:
+    - id: IEEE 802.16-2017
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 802.16-2017
+      format: text/plain
+  description:
+    content: amends
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 - type: updates
   bibitem:
     id: IEEE802.16-2017
diff --git a/data/IEEE_P802.15.7A_D-7-2024-05.yaml b/data/IEEE_P802.15.7A_D-7-2024-05.yaml
index 73dcd4db300..77af16318e5 100644
--- a/data/IEEE_P802.15.7A_D-7-2024-05.yaml
+++ b/data/IEEE_P802.15.7A_D-7-2024-05.yaml
@@ -408,6 +408,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE802.15.7-2018
+    docid:
+    - id: IEEE 802.15.7-2018
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 802.15.7-2018
+      format: text/plain
+  description:
+    content: amends
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Optical communication equipment
diff --git a/data/IEEE_P802.15.7A_D-8-2024-07.yaml b/data/IEEE_P802.15.7A_D-8-2024-07.yaml
index 3ddc282a394..b03c45be425 100644
--- a/data/IEEE_P802.15.7A_D-8-2024-07.yaml
+++ b/data/IEEE_P802.15.7A_D-8-2024-07.yaml
@@ -323,6 +323,40 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE802.15.7-2018
+    docid:
+    - id: IEEE 802.15.7-2018
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 802.15.7-2018
+      format: text/plain
+  description:
+    content: amends
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE802.15.7-2018
+    docid:
+    - id: IEEE 802.15.7-2018
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 802.15.7-2018
+      format: text/plain
+  description:
+    content: amends
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: amendment
 - content: IEEE 802.15.7
diff --git a/data/IEEE_P802.3.2_D-3.0-2024-08.yaml b/data/IEEE_P802.3.2_D-3.0-2024-08.yaml
index fb9d6f76847..4a4436a234c 100644
--- a/data/IEEE_P802.3.2_D-3.0-2024-08.yaml
+++ b/data/IEEE_P802.3.2_D-3.0-2024-08.yaml
@@ -167,6 +167,40 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE802.3.2-2019
+    docid:
+    - id: IEEE 802.3.2-2019
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 802.3.2-2019
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE802.3.2-2019
+    docid:
+    - id: IEEE 802.3.2-2019
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 802.3.2-2019
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Ethernet
diff --git a/data/IEEE_P837.yaml b/data/IEEE_P837.yaml
index 417ec679742..16c954f7cd7 100644
--- a/data/IEEE_P837.yaml
+++ b/data/IEEE_P837.yaml
@@ -205,6 +205,40 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE837-2014
+    docid:
+    - id: IEEE 837-2014
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 837-2014
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE837-2014
+    docid:
+    - id: IEEE 837-2014
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 837-2014
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: conductor
 - content: conductor combination
diff --git a/data/IEEE_P837_D-E2-2024.yaml b/data/IEEE_P837_D-E2-2024.yaml
index 7b65ba56871..2d6fd02a6f1 100644
--- a/data/IEEE_P837_D-E2-2024.yaml
+++ b/data/IEEE_P837_D-E2-2024.yaml
@@ -681,6 +681,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE837-2014
+    docid:
+    - id: IEEE 837-2014
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 837-2014
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: conductor
 - content: conductor combination
diff --git a/data/IEEE_PC37.09A_D-1.2-2024-07.yaml b/data/IEEE_PC37.09A_D-1.2-2024-07.yaml
index 94af24fd32c..43376e203d7 100644
--- a/data/IEEE_PC37.09A_D-1.2-2024-07.yaml
+++ b/data/IEEE_PC37.09A_D-1.2-2024-07.yaml
@@ -339,6 +339,57 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEEC37.09-2018
+    docid:
+    - id: IEEE C37.09-2018
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE C37.09-2018
+      format: text/plain
+  description:
+    content: amends
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: IEEEC37.09-2018
+    docid:
+    - id: IEEE C37.09-2018
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE C37.09-2018
+      format: text/plain
+  description:
+    content: amends
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: IEEEC37.09-2018
+    docid:
+    - id: IEEE C37.09-2018
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE C37.09-2018
+      format: text/plain
+  description:
+    content: amends
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: Low and high temperature test
 - content: service capability
diff --git a/data/IEEE_PC37.20.1_D-10-2024-06.yaml b/data/IEEE_PC37.20.1_D-10-2024-06.yaml
index d26f7c157d4..5a0baace0a6 100644
--- a/data/IEEE_PC37.20.1_D-10-2024-06.yaml
+++ b/data/IEEE_PC37.20.1_D-10-2024-06.yaml
@@ -469,6 +469,40 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEEC37.20.1-2015
+    docid:
+    - id: IEEE C37.20.1-2015
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE C37.20.1-2015
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: IEEEC37.20.1-2015
+    docid:
+    - id: IEEE C37.20.1-2015
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE C37.20.1-2015
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: circuit breaker
 - content: control
diff --git a/data/IEEE_PC37.20.7_D-8-2024-03.yaml b/data/IEEE_PC37.20.7_D-8-2024-03.yaml
index 28d8e83848b..d4bbcea6dc1 100644
--- a/data/IEEE_PC37.20.7_D-8-2024-03.yaml
+++ b/data/IEEE_PC37.20.7_D-8-2024-03.yaml
@@ -651,6 +651,40 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEEC37.20.7-2017
+    docid:
+    - id: IEEE C37.20.7-2017
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE C37.20.7-2017
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: IEEEC37.20.7-2017
+    docid:
+    - id: IEEE C37.20.7-2017
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE C37.20.7-2017
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Arc discharges
diff --git a/data/IEEE_PC37.20.7_D-9-2024-05.yaml b/data/IEEE_PC37.20.7_D-9-2024-05.yaml
index 93ef085d3c8..82dec211c44 100644
--- a/data/IEEE_PC37.20.7_D-9-2024-05.yaml
+++ b/data/IEEE_PC37.20.7_D-9-2024-05.yaml
@@ -226,6 +226,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEEC37.20.7-2017
+    docid:
+    - id: IEEE C37.20.7-2017
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE C37.20.7-2017
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Arc discharges
diff --git a/data/IEEE_PC37.20.9A_D-1-2024-01.yaml b/data/IEEE_PC37.20.9A_D-1-2024-01.yaml
index c29bbe9843e..62b5cdc44f1 100644
--- a/data/IEEE_PC37.20.9A_D-1-2024-01.yaml
+++ b/data/IEEE_PC37.20.9A_D-1-2024-01.yaml
@@ -667,6 +667,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEEC37.20.9-2019
+    docid:
+    - id: IEEE C37.20.9-2019
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE C37.20.9-2019
+      format: text/plain
+  description:
+    content: amends
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Switchgear
diff --git a/data/IEEE_PC37.20.9A_D-2-2023-09.yaml b/data/IEEE_PC37.20.9A_D-2-2023-09.yaml
index f69b541e489..ffd88f894ba 100644
--- a/data/IEEE_PC37.20.9A_D-2-2023-09.yaml
+++ b/data/IEEE_PC37.20.9A_D-2-2023-09.yaml
@@ -888,6 +888,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEEC37.20.9-2019
+    docid:
+    - id: IEEE C37.20.9-2019
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE C37.20.9-2019
+      format: text/plain
+  description:
+    content: amends
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Standards
diff --git a/data/IEEE_PC37.20.9A_D-4-2024-04.yaml b/data/IEEE_PC37.20.9A_D-4-2024-04.yaml
index c273436aa0f..95793eeb114 100644
--- a/data/IEEE_PC37.20.9A_D-4-2024-04.yaml
+++ b/data/IEEE_PC37.20.9A_D-4-2024-04.yaml
@@ -684,6 +684,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEEC37.20.9-2019
+    docid:
+    - id: IEEE C37.20.9-2019
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE C37.20.9-2019
+      format: text/plain
+  description:
+    content: amends
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Standards
diff --git a/data/IEEE_PC37.20.9A_D-5-2024-04.yaml b/data/IEEE_PC37.20.9A_D-5-2024-04.yaml
index ef8aeaf5c0a..4ddc7af7198 100644
--- a/data/IEEE_PC37.20.9A_D-5-2024-04.yaml
+++ b/data/IEEE_PC37.20.9A_D-5-2024-04.yaml
@@ -854,6 +854,40 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEEC37.20.9-2019
+    docid:
+    - id: IEEE C37.20.9-2019
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE C37.20.9-2019
+      format: text/plain
+  description:
+    content: amends
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: IEEEC37.20.9-2019
+    docid:
+    - id: IEEE C37.20.9-2019
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE C37.20.9-2019
+      format: text/plain
+  description:
+    content: amends
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Metal enclosures
diff --git a/data/IEEE_PC37.41_D-5C-2024.yaml b/data/IEEE_PC37.41_D-5C-2024.yaml
index 9285135bffa..db71c1a2932 100644
--- a/data/IEEE_PC37.41_D-5C-2024.yaml
+++ b/data/IEEE_PC37.41_D-5C-2024.yaml
@@ -462,6 +462,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEEC37.41-2016
+    docid:
+    - id: IEEE C37.41-2016
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE C37.41-2016
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Fuses
diff --git a/data/IEEE_PC37.41_D-6-2024-07.yaml b/data/IEEE_PC37.41_D-6-2024-07.yaml
index 0e400754f90..c1376d6d2fa 100644
--- a/data/IEEE_PC37.41_D-6-2024-07.yaml
+++ b/data/IEEE_PC37.41_D-6-2024-07.yaml
@@ -275,6 +275,40 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEEC37.41-2016
+    docid:
+    - id: IEEE C37.41-2016
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE C37.41-2016
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: IEEEC37.41-2016
+    docid:
+    - id: IEEE C37.41-2016
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE C37.41-2016
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Fuses
diff --git a/data/IEEE_PC37.74_D-2.0-2023-12.yaml b/data/IEEE_PC37.74_D-2.0-2023-12.yaml
index 831582ac280..9fe973f9d75 100644
--- a/data/IEEE_PC37.74_D-2.0-2023-12.yaml
+++ b/data/IEEE_PC37.74_D-2.0-2023-12.yaml
@@ -375,6 +375,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEEC37.74-2014
+    docid:
+    - id: IEEE C37.74-2014
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE C37.74-2014
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Switchgear
diff --git a/data/IEEE_PC37.74_D-3.3-2024-08.yaml b/data/IEEE_PC37.74_D-3.3-2024-08.yaml
index bfe1b4028ab..898d15d38ec 100644
--- a/data/IEEE_PC37.74_D-3.3-2024-08.yaml
+++ b/data/IEEE_PC37.74_D-3.3-2024-08.yaml
@@ -239,6 +239,40 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEEC37.74-2014
+    docid:
+    - id: IEEE C37.74-2014
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE C37.74-2014
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: IEEEC37.74-2014
+    docid:
+    - id: IEEE C37.74-2014
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE C37.74-2014
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Switchgear
diff --git a/data/IEEE_PC57.105-2019.yaml b/data/IEEE_PC57.105-2019.yaml
index b4360915d65..3b891ad7cfc 100644
--- a/data/IEEE_PC57.105-2019.yaml
+++ b/data/IEEE_PC57.105-2019.yaml
@@ -938,6 +938,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEEC57.105-2019
+    docid:
+    - id: IEEE C57.105-2019
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE C57.105-2019
+      format: text/plain
+  description:
+    content: corrects
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Ferroresonance
diff --git a/data/IEEE_PC57.105_D-1_COR1-2022.yaml b/data/IEEE_PC57.105_D-1_COR1-2022.yaml
index 50d990ea1e5..9896ff0a01b 100644
--- a/data/IEEE_PC57.105_D-1_COR1-2022.yaml
+++ b/data/IEEE_PC57.105_D-1_COR1-2022.yaml
@@ -790,6 +790,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEEC57.105-2019
+    docid:
+    - id: IEEE C57.105-2019
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE C57.105-2019
+      format: text/plain
+  description:
+    content: corrects
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Transformers
diff --git a/data/IEEE_PC57.105_D-3_COR1-2023-06.yaml b/data/IEEE_PC57.105_D-3_COR1-2023-06.yaml
index f64a1e570c3..21762ca27bb 100644
--- a/data/IEEE_PC57.105_D-3_COR1-2023-06.yaml
+++ b/data/IEEE_PC57.105_D-3_COR1-2023-06.yaml
@@ -683,6 +683,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEEC57.105-2019
+    docid:
+    - id: IEEE C57.105-2019
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE C57.105-2019
+      format: text/plain
+  description:
+    content: corrects
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Power transformers
diff --git a/data/IEEE_PC57.12.28_D-5-2023-02.yaml b/data/IEEE_PC57.12.28_D-5-2023-02.yaml
index f1c1703bdff..61100887c24 100644
--- a/data/IEEE_PC57.12.28_D-5-2023-02.yaml
+++ b/data/IEEE_PC57.12.28_D-5-2023-02.yaml
@@ -613,6 +613,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEEC57.12.28-2014
+    docid:
+    - id: IEEE C57.12.28-2014
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE C57.12.28-2014
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Metal enclosures
diff --git a/data/IEEE_PC57.12.28_D-7.3-2023-09.yaml b/data/IEEE_PC57.12.28_D-7.3-2023-09.yaml
index 60caaf3349a..d9f76af7820 100644
--- a/data/IEEE_PC57.12.28_D-7.3-2023-09.yaml
+++ b/data/IEEE_PC57.12.28_D-7.3-2023-09.yaml
@@ -987,6 +987,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEEC57.12.28-2014
+    docid:
+    - id: IEEE C57.12.28-2014
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE C57.12.28-2014
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: coating integrity
 - content: enclosure integrity
diff --git a/data/IEEE_PC57.12.29_D-2.5-2023-02.yaml b/data/IEEE_PC57.12.29_D-2.5-2023-02.yaml
index 83bdd612ebf..96a29b8c52e 100644
--- a/data/IEEE_PC57.12.29_D-2.5-2023-02.yaml
+++ b/data/IEEE_PC57.12.29_D-2.5-2023-02.yaml
@@ -394,6 +394,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEEC57.12.29-2014
+    docid:
+    - id: IEEE C57.12.29-2014
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE C57.12.29-2014
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Metal enclosures
diff --git a/data/IEEE_PC57.12.29_D-7.3-2023-09.yaml b/data/IEEE_PC57.12.29_D-7.3-2023-09.yaml
index a376393e475..d1126a8044c 100644
--- a/data/IEEE_PC57.12.29_D-7.3-2023-09.yaml
+++ b/data/IEEE_PC57.12.29_D-7.3-2023-09.yaml
@@ -768,6 +768,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEEC57.12.29-2014
+    docid:
+    - id: IEEE C57.12.29-2014
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE C57.12.29-2014
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Coatings
diff --git a/data/ISO_IEC_IEEE_8802.22-2015.yaml b/data/ISO_IEC_IEEE_8802.22-2015.yaml
index 44beebe4d84..f30ed0c06ae 100644
--- a/data/ISO_IEC_IEEE_8802.22-2015.yaml
+++ b/data/ISO_IEC_IEEE_8802.22-2015.yaml
@@ -355,6 +355,26 @@ relation:
     formattedref:
       content: IEEE 802.22-2011
       format: text/plain
+- type: adoptedFrom
+  bibitem:
+    id: IEEE802.22-2011
+    docid:
+    - id: IEEE 802.22-2011
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 802.22-2011
+      format: text/plain
+- type: adoptedFrom
+  bibitem:
+    id: IEEE802.22-2011
+    docid:
+    - id: IEEE 802.22-2011
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 802.22-2011
+      format: text/plain
 keyword:
 - content: IEEE Standards
 - content: IEC Standards
diff --git a/data/ISO_IEC_IEEE_CD_P26513-2024-06.yaml b/data/ISO_IEC_IEEE_CD_P26513-2024-06.yaml
index bbc858b31ed..bb5b03015b8 100644
--- a/data/ISO_IEC_IEEE_CD_P26513-2024-06.yaml
+++ b/data/ISO_IEC_IEEE_CD_P26513-2024-06.yaml
@@ -113,6 +113,40 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: ISO-IEC-IEEE26513-2017
+    docid:
+    - id: ISO/IEC/IEEE 26513-2017
+      type: IEEE
+      primary: true
+    formattedref:
+      content: ISO/IEC/IEEE 26513-2017
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: ISO-IEC-IEEE26513-2017
+    docid:
+    - id: ISO/IEC/IEEE 26513-2017
+      type: IEEE
+      primary: true
+    formattedref:
+      content: ISO/IEC/IEEE 26513-2017
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: ISO Standards
diff --git a/data/ISO_IEEE_11073.10472-2024.yaml b/data/ISO_IEEE_11073.10472-2024.yaml
new file mode 100644
index 00000000000..578fa793dbe
--- /dev/null
+++ b/data/ISO_IEEE_11073.10472-2024.yaml
@@ -0,0 +1,118 @@
+---
+schema-version: v1.2.3
+id: ISO-IEEE11073.10472-2024
+title:
+- content: 'ISO/IEEE International Standard: Health informatics--Device interoperability--Part
+    10472: Personal health device communication--Device specialization--Medication
+    monitor'
+  format: text/plain
+  type: main
+link:
+- content: https://ieeexplore.ieee.org/document/10679670
+  type: src
+type: standard
+docid:
+- id: ISO/IEEE 11073.10472-2024
+  type: IEEE
+  primary: true
+- id: ISO/IEEE 11073.10472™-2024
+  type: IEEE
+  scope: trademark
+  primary: true
+- id: 979-8-8557-1235-3
+  type: ISBN
+- id: 10.1109/IEEESTD.2024.10679670
+  type: DOI
+docnumber: ISO/IEEE 11073.10472-2024
+date:
+- type: created
+  value: '2024'
+- type: published
+  value: '2024-09-12'
+- type: issued
+  value: '2024'
+contributor:
+- organization:
+    name:
+    - content: Institute of Electrical and Electronics Engineers
+    abbreviation:
+      content: IEEE
+    url: http://www.ieee.org
+    contact:
+    - address:
+        city: New York
+        country: USA
+  role:
+  - type: publisher
+revdate: '2024-09-12'
+language:
+- en
+script:
+- Latn
+abstract:
+- content: Within the context of the ISO/IEEE 11073 family of standards for device
+    communication, a normative definition of communication between personal telehealth
+    medication monitor devices and compute engines (e.g., cell phones, personal computers,
+    personal health appliances, set top boxes) is established by this standard in
+    a manner that enables plug-and-play interoperability. Appropriate portions of
+    existing standards including ISO/IEEE 11073 terminology, information models, application
+    profile standards, and transport standards are leveraged. The use of specific
+    term codes, formats, and behaviors in telehealth environments restricting optionality
+    in base frameworks in favor of interoperability are specified. A common core of
+    communication functionality for personal telehealth medication monitor devices
+    is defined in this standard.
+  language:
+  - en
+  script:
+  - Latn
+  format: text/plain
+docstatus:
+  stage:
+    value: approved
+copyright:
+- owner:
+  - name:
+    - content: Institute of Electrical and Electronics Engineers
+    abbreviation:
+      content: IEEE
+    url: http://www.ieee.org
+  - name:
+    - content: ISO
+  from: '2024'
+relation:
+- type: adoptedFrom
+  bibitem:
+    id: IEEE11073.10472-2023
+    docid:
+    - id: IEEE 11073.10472-2023
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 11073.10472-2023
+      format: text/plain
+keyword:
+- content: IEEE Standards
+- content: ISO Standards
+- content: Biomedical monitoring
+- content: Medical devices
+- content: Bioinformatics
+- content: Interoperability
+- content: Drug delivery
+- content: device communication
+- content: IEEE 11073-10472™
+- content: medication monitor
+- content: personal health devices
+doctype: standard
+editorialgroup:
+  committee:
+  - IEEE 11073 Standards Committee of the IEEE Engineering in Medicine and Biology
+    Society
+ics:
+- code: 35.240.80
+  text: IT applications in health care technology
+ext:
+  schema-version: v1.0.0
+  standard_status: Active
+  standard_modified: Approved
+  pubstatus: Active
+  holdstatus: Publish