[Bugfix] Fixed tests and examples for API change

JITx-Inc · Sep 30, 2024 · c8578fa · c8578fa
1 parent 3436dea
commit c8578fa
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Showing 2 changed files with 3 additions and 3 deletions.
diff --git a/examples/landpatterns/SMT.stanza b/examples/landpatterns/SMT.stanza
@@ -46,7 +46,7 @@ pcb-component test-SMT (case:String):
     [p[2] | p[2] | Down | 0]
 
   assign-symbol(test-sym)
-  val pkg = get-resistor-pkg(case, DensityLevelC)
+  val pkg = get-resistor-pkg(case, density-level = DensityLevelC)
 
   val lp = create-landpattern(pkg)
   assign-landpattern(lp)

diff --git a/tests/landpatterns/two-pin/SMT.stanza b/tests/landpatterns/two-pin/SMT.stanza
@@ -168,7 +168,7 @@ deftest(two-pin) test-resistor-smt :
 
 deftest(two-pin) test-capacitor-smt :
 
-  val pkg = get-capacitor-pkg("1206", DensityLevelB)
+  val pkg = get-capacitor-pkg("1206", density-level = DensityLevelB)
 
   val lp = create-landpattern(pkg)
   val grid = PadGrid(lp)
@@ -189,7 +189,7 @@ deftest(two-pin) test-capacitor-smt :
 
 deftest(two-pin) test-capacitor-smt-with-pose:
 
-  val pkg = get-capacitor-pkg("1206", DensityLevelB)
+  val pkg = get-capacitor-pkg("1206", density-level = DensityLevelB)
 
   val lp = create-landpattern(pkg, pose = loc(-0.5, 0.0))
   val grid = PadGrid(lp)