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ietf-tools · Sep 16, 2024 · 736f8de · 736f8de
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diff --git a/data/ANSI_C63.14-2014.yaml b/data/ANSI_C63.14-2014.yaml
@@ -704,6 +704,40 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: ANSIC63.14-2009
+    docid:
+    - id: ANSI C63.14-2009
+      type: IEEE
+      primary: true
+    formattedref:
+      content: ANSI C63.14-2009
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: ANSIC63.14-2009
+    docid:
+    - id: ANSI C63.14-2009
+      type: IEEE
+      primary: true
+    formattedref:
+      content: ANSI C63.14-2009
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: ANSI standards
 - content: Dictionaries

diff --git a/data/ANSI_C63.14-2014_REDLINE.yaml b/data/ANSI_C63.14-2014_REDLINE.yaml
@@ -485,6 +485,40 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: ANSIC63.14-2009
+    docid:
+    - id: ANSI C63.14-2009
+      type: IEEE
+      primary: true
+    formattedref:
+      content: ANSI C63.14-2009
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: ANSIC63.14-2009
+    docid:
+    - id: ANSI C63.14-2009
+      type: IEEE
+      primary: true
+    formattedref:
+      content: ANSI C63.14-2009
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: ANSI C63.14
 - content: electromagnetic compatibility (EMC)

diff --git a/data/ANSI_C63.15-2010.yaml b/data/ANSI_C63.15-2010.yaml
@@ -191,6 +191,16 @@ relation:
     formattedref:
       content: ANSI C63.15-2017
       format: text/plain
+- type: obsoletedBy
+  bibitem:
+    id: ANSIC63.15-2017
+    docid:
+    - id: ANSI C63.15-2017
+      type: IEEE
+      primary: true
+    formattedref:
+      content: ANSI C63.15-2017
+      format: text/plain
 keyword:
 - content: IEEE standards
 - content: electromagnetic compatibility

diff --git a/data/ANSI_N42.34-2015.yaml b/data/ANSI_N42.34-2015.yaml
@@ -657,6 +657,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: ANSIN42.34-2006
+    docid:
+    - id: ANSI N42.34-2006
+      type: IEEE
+      primary: true
+    formattedref:
+      content: ANSI N42.34-2006
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: ANSI Standards
 - content: Gamma rays

diff --git a/data/ANSI_USEMCSC_C63.2-2023.yaml b/data/ANSI_USEMCSC_C63.2-2023.yaml
@@ -1097,6 +1097,40 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: ANSIC63.2-2016
+    docid:
+    - id: ANSI C63.2-2016
+      type: IEEE
+      primary: true
+    formattedref:
+      content: ANSI C63.2-2016
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: ANSIC63.2-2016
+    docid:
+    - id: ANSI C63.2-2016
+      type: IEEE
+      primary: true
+    formattedref:
+      content: ANSI C63.2-2016
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Electromagnetic interference

diff --git a/data/ANSI_USEMCSC_C63.2-2023_REDLINE.yaml b/data/ANSI_USEMCSC_C63.2-2023_REDLINE.yaml
@@ -70,6 +70,40 @@ copyright:
     url: http://www.ieee.org
   from: '2023'
 relation:
+- type: updates
+  bibitem:
+    id: ANSIC63.2-2016
+    docid:
+    - id: ANSI C63.2-2016
+      type: IEEE
+      primary: true
+    formattedref:
+      content: ANSI C63.2-2016
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
+- type: updates
+  bibitem:
+    id: ANSIC63.2-2016
+    docid:
+    - id: ANSI C63.2-2016
+      type: IEEE
+      primary: true
+    formattedref:
+      content: ANSI C63.2-2016
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 - type: updates
   bibitem:
     id: ANSIC63.2-2016

diff --git a/data/IEEE_1003.1-2017.yaml b/data/IEEE_1003.1-2017.yaml
@@ -525,6 +525,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE1003.1-2008
+    docid:
+    - id: IEEE 1003.1-2008
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 1003.1-2008
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Operating systems

diff --git a/data/IEEE_11073.10419-2017.yaml b/data/IEEE_11073.10419-2017.yaml
@@ -662,6 +662,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE11073.10419-2015
+    docid:
+    - id: IEEE 11073.10419-2015
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 11073.10419-2015
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Medical devices

diff --git a/data/IEEE_11073.10419-2017_REDLINE.yaml b/data/IEEE_11073.10419-2017_REDLINE.yaml
@@ -647,6 +647,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE11073.10419-2015
+    docid:
+    - id: IEEE 11073.10419-2015
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 11073.10419-2015
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE Standards
 - content: Medical services

diff --git a/data/IEEE_1366-2012.yaml b/data/IEEE_1366-2012.yaml
@@ -355,6 +355,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE1366-2003
+    docid:
+    - id: IEEE 1366-2003
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 1366-2003
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE standards
 - content: Indexes

diff --git a/data/IEEE_1366-2012_REDLINE.yaml b/data/IEEE_1366-2012_REDLINE.yaml
@@ -168,6 +168,23 @@ relation:
     script:
     - Latn
     format: text/plain
+- type: updates
+  bibitem:
+    id: IEEE1366-2003
+    docid:
+    - id: IEEE 1366-2003
+      type: IEEE
+      primary: true
+    formattedref:
+      content: IEEE 1366-2003
+      format: text/plain
+  description:
+    content: revises
+    language:
+    - en
+    script:
+    - Latn
+    format: text/plain
 keyword:
 - content: IEEE standards
 - content: Power system reliability